LIV100

The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not ca ...Read more

 

The LIV100 is a short pulse test system for
the electro-optical characterization of laser
diodes and LEDs at the chip, bar or submount
level. 

The fast rise time with essentially no overshoot
allows testing these thermally “naked” devices
without undue thermal loading.

The standard instruments are not capable of
CW testing.

CHARACTERISTICS

Pulsed testing only
Maximum currents: 250mA up to 600A
Maximum number of current steps: 4000
Interface: USB
Rise time: 50ns (F-version); 500ns (L-version);
1µs (XL-version)
Throughput: typically 1s per device



The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing.

We offer three versions of the LIV100 differing in speed and pulse length. Each version is available in any given maximum current (denoted by “xxx” in the list below).

  • LIV100-Fxxx: fast version with 50ns rise time and pulse durations from 150ns. 
                        The longest pulse length at maximum current is typically limited to 10µs.
  • LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs.
                        The longest pulse length at maximum current is typically limited to 100µs.
  • LIV100-XLxxx: extra long pulse version with rise time of 1µs. The shortest pulse duration is 5µs.
                          The longest pulse length at maximum current is 2000µs.


PRINCIPLES OF OPPERATION

All three systems are controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously. The fast data acquisition provides for high throughput.

The LIV100 operates in pulsed mode only:

pulsed LIV mode                       

Pulsed LIV mode

The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:

pulsed burst mode

Pulsed burst mode

The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra.

Artifex Engineering supports this product with a custom strip line or contact card configuration service.


FIELDS OF APPLICATION

Applications include laser diode characterization before and after submounting or packaging, inspection of incoming goods and for OEMs. The software delivered with the unit allows for one-click generation of a full pdf data sheet for the device under test.

The short pulse capability of the LIV100 ensures that the device under test can be measured with negligible thermal loading. This fact can be exploited to determine the thermal resistance of the contact to a submount or package (see the “Tutorial” and “Downloads” tabs).

Rise time: 50ns (F-version); 500ns (L-version); 1µs (XL-version)

Maximum currents: 250mA up to 600A

Wavelength range: 250-1100nm; 400-1650nm

Simultaneous spectrum measurement

We will gladly adapt, for example, the wavelength or the current to suit your application. Let us know your requirements.

Integrating spheres

Strip line connectors

Mounts and vacuum chucks

TECs and TEC drivers

Can the LIV100 perform CW measurements?

The LIV100 cannot perform CW measurements in its standard form. However, we will gladly customize a unit to include CW capability, depending on your requirements. Please contact us for details.

Furthermore, if CW and pulsed testing is required, please consider our LIV120 series with pulse durations from 100µs to CW.

Spezifikationen LIV100

Spezifikationen LIV100 1