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Laser Diode Characterization System LIV100

  • Complete Solution
  • Currents up to 600 ampere
  • Very compact

Powerful short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing.

  • Pulsed testing only
  • Maximum currents: 250mA up to 600A
  • Maximum number of current steps: 4000
  • Interface: USB
  • Rise time: 50ns (F-version); 500ns (L-version);
    1µs (XL-version)
  • Throughput: typically 1s per device

The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing.

We offer three versions of the LIV100 differing in speed and pulse length. Each version is available in any given maximum current (denoted by “xxx” in the list below).

  • LIV100-Fxxx: fast version with 50ns rise time and pulse durations from 150ns. 
                        The longest pulse length at maximum current is typically limited to 10µs.
  • LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs.
                        The longest pulse length at maximum current is typically limited to 100µs.
  • LIV100-XLxxx: extra long pulse version with rise time of 1µs. The shortest pulse duration is 5µs.
                          The longest pulse length at maximum current is 2000µs.


PRINCIPLES OF OPPERATION

All three systems are controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously. The fast data acquisition provides for high throughput.

The LIV100 operates in pulsed mode only:

Laser Diode Characterization System LIV100 1                       

Pulsed LIV mode

The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:

Laser Diode Characterization System LIV100 2

Pulsed burst mode

The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra.

Artifex Engineering supports this product with a custom strip line or contact card configuration service.


FIELDS OF APPLICATION

Applications include laser diode characterization before and after submounting or packaging, inspection of incoming goods and for OEMs. The software delivered with the unit allows for one-click generation of a full pdf data sheet for the device under test.

The short pulse capability of the LIV100 ensures that the device under test can be measured with negligible thermal loading. This fact can be exploited to determine the thermal resistance of the contact to a submount or package (see the “Tutorial” and “Downloads” tab).

ParameterInstrument versionConditionsResolutionMinTypMaxUnit
Inputs:
  • 2x Transimpedance amplifier (1x reserved for power input, 1x free for second power channel)
  • 2x A/D converter reserved for current and voltage inputs
Sampling rateselectable: 20/n MS/s with n=1..20n.a.120MS/s
A/D Resolution13bit
Photodiode gainoptimum gain
automatically selected
1
10
V/mA
Transimpedance amplifier rise time1Input capacitance <20pF, gain = 1kΩ50ns
Output
Pulse duration2F20MS/s sampling rate
1MS/s sampling rate
0.050
1
0.150
1
100
2000
µs
Pulse duration2L20MS/s sampling rate
1MS/s sampling rate
0.050
1
2
2
100
2000
µs
Pulse duration2XL20MS/s sampling rate
1MS/s sampling rate
0.050
1
5
5
100
2000
µs
Rise timeF
L
XL
701
420
700
100
500
1000
ns
Current overshoot at maximum current5 05%
Pulse separationselectable: 50 ·n µs with n= 2..10 00050100500 000µs
Repetition rate100kHz
Current range (examples only: any current range from 1 A to 600A may be specified at time of purchase)LIV100-F002, -L002 or -XL002
LIV100-F040, -L040 or -XL040
LIV100-F080, -L080 or -XL080
LIV100-F120, -L120 or -XL120
LIV100-L200 or -XL200
LIV120-XL400
LIV120-XL600
0.0005
0.01
0.02
0.03
0.05
0.10
0.15
0.01
0.2
0.4
0.6
1.0
2.0
2.0
2
40
80
120
200
400
600
A
D/A resolution12bit
Compliance voltage8V
Duty cycle quick rise version
(examples only: any current range from 1A to 600A may be specified at time of purchase)
LIV100-F002
LIV100-F040
LIV100-F080
LIV100-F120
25
1.5
0.7
0.5
%
Duty cycle long pulse version
(examples only: any current range from 1A to 600A may be specified at time of purchase)
LIV100-L002
LIV100-L040
LIV100-L080
LIV100-L120
LIV100-L200
35
2.9
1.5
1.0
0.6
%
Duty cycle long pulse version
(examples only: any current range from 1A to 600A may be specified at time of purchase)
LIV100-XL002
LIV100-XL040
LIV100-XL080
LIV100-XL120
LIV100-XL200
LIV100-XL400
LIV100-XL600
35
2.9
1.5
1.0
0.6
0.3
0.2
%
Signal processing
Depth of storage512kB
Number of channels11250
PC Interface
TypeUSB; 100kB/s
Dimensions
DAQ unit114 x 150 x 125 (w x l x h)mm

1 F-versions at 60A. The maximum available current for the F-version is 120A.

2 With 2µs pulse width. Measurement of 200 pulses and 0,2% duty cycle.

3 Per ANSI/IEEE standard 181-1977: 10% – 90%.

4 Optimum sampling rate is automatically selected.

5 With optimized strip line connector, no load matching required

  • Rise time: 50ns (F-version); 500ns (L-version); 1µs (XL-version)
  • Maximum currents: 250mA up to 600A
  • Wavelength range: 250-1100nm; 400-1650nm
  • Simultaneous spectrum measurement

 

We will gladly adapt, for example, the wavelength or the current to suit your application. Let us know your requirements.

Introduction to our Laser Diode Characterization System

Discover the potential of our LIV100 in combination with our calibrated integrating spheres. We show exemplary measurements for the characterization of laser diodes and show you the measurement results in the GUI.

Laser Diode Characterization System LIV100 3
Play Video
Laser Diode Characterization System LIV100 4

Our Software Development Kit

The SDK package is a fixed, free component when purchasing a device.

It comes with the source code of the application program (in VB.net) and a LabView VI with the basic functions of the instrument. A description of the communication with the devices and a list of the commands used is also included.

For some devices (currently LDD100, LIV120 in preparation) there is a dll file (library file) with documentation and exemplary applications in VB.net and LabView.

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