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Laser Diode Characterization System LIV120

  • Turnkey Solutions
  • Pulsed, QCW and CW
  • LIV and Burn-In-Test

Powerful but low cost pulsed / QCW / CW test system for use in the lab as well as for OEM applications.

Ideal for

  • Diode characterization
  • Quality control of incoming goods
  • OEM

We offer this instrument with a variety of end stages covering current ranges from 250mA up to 20A in a compact enclosure and up to 1200A in 19” rack enclosures.

The LIV120 uses our extensive range of OPM150 laser power detector heads.

The measurement cycle typically takes less than 1s including the data transfer to the host computer.

  • Pulsed, QCW and CW testing including burn-in
  • Maximum currents: 250mA up to 1200A
  • Maximum number of current steps: 4000
  • Measures optical power, laser voltage, laser current and monitor diode current
  • Interface: USB
  • Throughput: typically 1s per device

The LIV120 is a powerful but low cost pulsed / QCW / CW test system for use in the lab as well as for OEM applications, ideal for

  • Diode characterization
  • Quality control of incoming goods
  • OEM


We offer this instrument with a variety of end stages covering current ranges from 250mA up to 20A in a compact enclosure and up to 1200A in 19” rack enclosures. The current ranges 250mA to 2A are forced air cooled. Above 2A in the compact enclosure, the unit is liquid cooled. Please contact us if liquid cooling is required for the low current versions.

The LIV120 uses our extensive range of OPM150 laser power detector heads with all of the comfort of intelligent head technology for cost efficient swapping of detector heads. This feature is very useful when testing a wide range of wavelengths or when testing free beam and fibre coupled lasers.

The measurement cycle typically takes less than 1s including the data transfer to the host computer.

PRINCIPLES OF OPERATION

A complete parameter set for a given measurement protocol may be uploaded to the LIV120. The LIV120 then takes over the measurement procedure. The unit drives the laser with the given prescription and performs the data acquisition and storage. The LIV120 operates both in CW and pulsed modes:

   

Laser Diode Characterization System LIV120 1

CW-LIV mode

Laser Diode Characterization System LIV120 2

Pulsed LIV mode

Many laser diodes of the same type may now be tested in this manner with very high throughput.

The LIV120 is capable of running in the so-called soft pulse mode. This means that the current between pulses in pulsed mode operation does not drop down to zero, but rather to the value of the minimum current set by the operater. Note the very clean, square shape of the current pulses.   

 

Laser Diode Characterization System LIV120 3  Laser Diode Characterization System LIV120 4 
 Current output (min. = 0) Current output (min. ≠0)

The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. All parameters (power, currents and voltage) are measured in this mode. Schematically this appears as follows: 

Laser Diode Characterization System LIV120 5

CW-burst mode

Laser Diode Characterization System LIV120 6

Pulsed burst mode

The burst mode is useful for lifetime testing, checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra.

Artifex Engineering supports this product with a custom connection line or contact card configuration service.

FIELDS OF APPLICATION

Applications include laser diode characterization after submounting or packaging, inspection of incoming goods and for OEMs. The software delivered with the unit allows for one-click generation of a full pdf data sheet for the device under test.

ParameterDevice typeConditionsMinTypMaxUnit
Input
Maximum power

Depending on the selected integrating sphere and detector head.

See OPM150 series for details!

Monitor diode currentLIV120-250
LIV120-500
LIV120-1000
LIV120-2000
gain 0
gain 1
gain 2
0.0025
0.00025
0.025
10
1
100
mA
mA
µA
Monitor diode currentLIV120-5A or higherNo measurement of monitor diode current
Output
Laser diode currentLIV120-250
LIV120-500
LIV120-1000
LIV120-2000
0.0625
0.125
0.250
0.500
250
500
1000
2000
mA
mA
mA
mA
Laser diode currentLIV120-5A
LIV120-10A
LIV120-20A
LIV120-40A
0.00125
0.0025
0.005
0.01
5
10
20
40
A
A
A
A
Laser diode currentLIV120-L100A
LIV120-L200A
LIV120-L400A
LIV120-L800A
LIV120-L1200A
0.025
0.05
0.1
0.2
0.3
100
200
400
800
1200
A
A
A
A
A
Compliance voltageLIV120-250 up to LIV120-20008V
Compliance voltageLIV120-5A up to LIV120-40A8V
Compliance voltageLIV120-100A10V
Compliance voltageLIV120-200A20V
Compliance voltageLIV120-400A up to LIV120-120010V
AccuracyLIV120-250 up to LIV120-20000.2%
AccuracyLIV120-5A up to LIV120-40A0.2%
AccuracyLIV120-100A bis 1200A0.5%
Rise time at full rated currentLIV120-250 up to LIV120-200025µs
Rise time at full rated currentLIV120-5A up to LIV120-40A610µs
Rise time at full rated currentLIV120-100A350400µs
Rise time at full rated currentLIV120-200 up to LIV120-1200A400500µs
Pulse durationLIV120-250 up to LIV120-2000pulse modes
CW modes
0.1
0.1
60000
120000
ms
Pulse durationLIV120-5A up to LIV120-40APulse modes
CW modes
0.22
0.22
60000
120000
ms
Pulse durationLIV120-100A up to LIV120-1200APulse modes
CW modes
1
1
60000
120000
ms
Duty cyclePulse modes
CW modes
0.0002
0.0002
99.99
100
%
%
Measurement time200µs
Measurement time11Tage
Number of measurements per channelLIV modes
Burst modes
1
1
4000
16380
Number of channels for measurementLIV120-250 up to LIV120-20004
  • optical power
  • laser current
  • laser voltage
  • photo diode current
Number of channels for measurementLIV100-L002
LIV120-5A up to LIV120-1200A
3
  • optical power
  • laser current
  • laser voltage
in general
Power supplyLIV120-250 up to LIV120-2000Wall plug
Power supplyLIV120-5A up to LIV120-40Atable top power supply
Power supplyLIV120-100A90265V (single phase)
Power supplyLIV120-200A up to LIV120-1200A342528V (three-phase)
CommunicationUSB2.0
DimensionsLIV120-250 up to LIV120-2000130 x 120 x 106 (w x l x h)mm
DimensionsLIV120-5A up to LIV120-40A130 x 120 x 106 (w x l x h)mm
DimensionsLIV120-100A19″ Rack 3U
DimensionsLIV120-200A up to LIV120-400A19″ Rack 4U
DimensionsLIV120-800A19″ Rack 2 x 4U
DimensionsLIV120-1200A19″ Rack 3 x U
  • Maximum currents: 250mA up to 1200A
  • Wavelength range: 250-1100nm; 400-1650nm
  • Simultaneous spectrum measurement

We will gladly adapt, for example, the wavelength or the current to suit your application. Let us know your requirements.

Integrating Spheres

Connection lines

Mounts

TECs and TEC drivers

Introduction to our Laser Diode Characterization System

Discover the potential of our LIV120 in combination with our detector heads and calibrated integrating spheres. We show exemplary measurements for the characterization of laser diodes and show you measurement results in the GUI.
Laser Diode Characterization System LIV120 7
Play Video
Laser Diode Characterization System LIV120 8

Our Software Development Kit

The SDK package is a fixed, free component when purchasing a device.

It comes with the source code of the application program (in VB.net) and a LabView VI with the basic functions of the instrument. A description of the communication with the devices and a list of the commands used is also included.

For some devices (currently LDD100, LIV120 in preparation) there is a dll file (library file) with documentation and exemplary applications in VB.net and LabView.

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