Downloads
English – Laser Diode Characterization System LIV100
Chinese – Laser Diode Characterization System LIV100
English – How to use the LIV contact card
Chinese – How to use the LIV contact card
English – LIV100 Single emitter contacting on laser bar
Chinese – LIV100 Single emitter contacting on laser bar
Frequently Asked Questions
What does LIV stand for?
LIV stands for Light-Current-Voltage, referring to the three parameters measured during laser diode characterization.
What measurements can the LIV100 perform?
Typical measurements include:
– L-I curves (optical power vs current)
– V-I curves (forward voltage vs current)
– Threshold current
– Slope efficiency
What types of devices can be tested?
– Laser diodes
– LEDs
– VCSELs
– Photonic components requiring current and optical characterization
What is the difference between LIV100 and LIV120?
The LIV100 is a short pulse device used for unpackaged devices such as chips or bars. The LIV120 is a QCW/CW device generally used for mounted or packaged devices such as TO and CS mounts.
I require a specific current range that I do not see on your website or brochure, is it possible to request custom current or voltage ranges?
It is typically straightforward to adjust these ranges, simply inquire with your requirements and a device will be matched to your project.
How is optical power measured during LIV testing?
Using an integrated detector such as a photodiode or integrating sphere connected to the system.
What is threshold current?
The threshold current is the current level at which the laser diode begins to emit coherent laser light.
What is slope efficiency?
Slope efficiency describes how efficiently current is converted into optical power above the threshold.
Can pulsed measurements be performed?
Yes. Pulsed operation reduces heating effects during measurement.
How do I connect a laser diode to the LIV100?
The LIV100 uses strip line technology to minimize inductance. The laser diode is connected via the output terminals with proper polarity. Contact cards are available upon request for custom connection configurations.
What maintenance is required?
Typical maintenance includes:
– periodic calibration
– connector inspection
– optical surface cleaning (dusting with clean, dry air only)
Can the LIV system be automated?
The system supports automated measurements via software control.
Can temperature control be integrated?
Thermoelectric controllers and temperature-controlled stages can be added.
Is it suitable for production testing?
Yes, especially for automated LIV sweeps. The system can perform complete laser characterization measurements in extremely short time for high throughput.
Are Artifex devices suitable for laboratory research?
Yes, they are designed for both research and industrial testing environments.
Do the instruments support computer control?
Artifex instruments support PC control for automation and data acquisition.
What software is used to control the devices?
Custom control software or compatible measurement platforms can be used.
Can multiple devices be integrated into a single test setup?
Users may combine devices such as laser drivers, power meters, and integrating spheres.
Do Artifex devices support automated testing systems?
All Artifex devices can be integrated into automated optical test stations. Instruments with software come with a full software development kit (SDK) including our graphical user interface (GUI), source code and typically a LabView VI and / or Python driver.
What maintenance is required?
Typical maintenance includes:
– periodic calibration
– connector inspection
– optical surface cleaning
Where can I get technical support?
Technical support is available through Artifex Engineering.
