The LIV Laser Characterization Series of instruments are measurement systems for the electro-optical laser diode characterization and LED characterization, whether packaged or in bare chip form.
These source measurement units (SMU) perform complete laser characterization measurements in extremely short time for high throughput.
The turnkey laser diode testing systems LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control LIV measurements. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom source measurement units are available with even more current!
Applications include characterization of laser diodes and LEDs before and after submounting or packaging, inspection of incoming goods and for OEMs. The fast data acquisition provides for high throughput. Artifex Engineering supports this high current laser diode tester with a custom strip line or contact card configuration service.
The LIV100 is a powerful short-pulse laser diode characterization system designed for testing laser diodes and LEDs at the chip, bar, or submount level. Its extremely fast rise time with virtually no overshoot enables accurate measurements of thermally “naked” devices while minimizing thermal stress on the device under test.
The system supports CW testing up to a maximum current of 20 A and offers pulsed operation with pulse durations ranging from 150 ns to 2000 µs. The fast rise-time version achieves rise and fall times of just 50 ns at currents up to 60 A, ensuring precise control of the drive current.
This unique performance allows reliable high-power laser diode (HPLD) testing, even for sensitive devices at the chip or bar level, without introducing significant thermal loading. As a result, the LIV100 enables highly accurate LIV characterization while protecting delicate semiconductor laser structures during measurement.
The LIV120 is a versatile CW/QCW laser diode tester designed for reliable characterization and testing of laser diodes and LEDs. It combines powerful measurement capabilities with a compact design and offers full single-channel burn-in functionality, making it suitable for both laboratory environments and OEM integration.
The system is controlled via a USB interface, enabling fully automated measurements from a host computer. A predefined parameter set is uploaded to the instrument, and once the measurement is started, the LIV120 performs the complete test sequence autonomously. This ensures consistent and repeatable measurements while reducing operator effort.
Designed as a powerful yet cost-effective pulsed, QCW, and CW laser diode characterization system, the LIV120 supports a wide range of testing applications including diode characterization, incoming goods quality control, and OEM integration.
The unit is available with different source measurement unit (SMU) output stages, covering current ranges from 250 mA up to 40 A in a compact enclosure, and up to 1200 A in 19-inch rack systems for high-power applications. For optical power measurements, the LIV120 is compatible with our OPM150 laser power detector heads, ensuring precise and reliable power detection.
Thanks to its optimized architecture, a complete measurement cycle typically takes less than one second, including data transfer to the host computer, enabling fast and efficient device testing in both research and production environments.
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