Laser Diode Characterization Systems

PROPERTIES

The laser diode characterization systems LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!

The LIV100 is a pulsed system with pulse durations of 150ns to 2000µs. The fast rise-time version boasts rise and fall times of 50ns (at 60A) – essentially without overshoot. This unique feature allows accurate testing of high power diode lasers at the chip or bar level without undue thermal loading of the device under test.

The LIV120 is our popular CW/QCW tester with loads of features and full burn-in capability.
Both systems are controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously.

FIELDS OF APPLICATION

Applications include laser diode characterization before and after submounting or packaging, inspection of incoming goods and for OEMs. The fast data acquisition provides for high throughput. Artifex Engineering supports this product with a custom strip line or contact card configuration service.