Laser Diode Characterization Systems

PROPERTIES

The laser diode characterization systems LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control LIV measurements. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom source measurement units are available with even more current!

The LIV100 is a pulsed system with pulse durations of 150ns to 2000µs. The fast rise-time version boasts rise and fall times of 50ns (at 60A) – essentially without overshoot. This unique feature allows accurate high power lasers diode testing (HPLD testing) at the chip or bar level without undue thermal loading of the device under test.

The LIV120 is our popular CW/QCW tester with loads of features and full single channel burn-in capability.
Both systems are controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously.

FIELDS OF APPLICATION

Applications include characterization of LED and laser diodes before and after submounting or packaging, inspection of incoming goods and for OEMs. The fast data acquisition provides for high throughput. Artifex Engineering supports this high current laser diode tester with a custom strip line or contact card configuration service.