Probe Contact Cards | Needle Cards | VCSEL Test Fixtures
- Precision contacting for laser diode and VCSEL devices – standard solutions for full emitter bars
- Custom cards for single emitters and research devices
- Low impedance electrical path, designed for high-current pulsed testing
- Flexible designs available for VCSEL arrays
Standard Bar Length: 5 mm, 10 mm, 20 mm
Contact Type: Precision Spring Probes
Custom Designs: Yes
Single Emitter Cards: Made to Order
VCSEL Solutions: Yes
High Current Compatible: Yes
CAD Reference Available: Yes
Artifex Engineering Contact Cards provide reliable electrical contacting for semiconductor laser devices during characterization and production testing.
Our standard contact cards are available for 5 mm, 10 mm and 20 mm laser bars, offering repeatable contacting with precision spring probes. These cards are designed to simplify laboratory measurements while providing stable electrical performance for CW and pulsed operation.
For single emitters, every device has unique dimensions, bond pad layouts, and chip thicknesses. Because of this, we manufacture custom contact cards tailored to each device, ensuring optimal alignment, contact force, and measurement repeatability.
We also design flexible contact card solutions for VCSEL arrays, where custom geometries and dense contact spacing are often required.
Whether testing research prototypes or production devices, our probe cards provide a robust platform for accurate electrical measurements.
Standard Contact Cards
5 mm Laser Bars – Designed for standard 5 mm laser diode bars
Features:
- Precision spring probe contacting
- Repeatable alignment
- Low contact resistance
- Suitable for CW and pulsed testing
- Compatible with custom mounting fixtures
10 mm Laser Bars – Optimized for medium – length laser bars commonly used in industrial diode laser systems.
Features:
- Uniform contact pressure across the full bar
- High-current capable design
- Excellent repeatability
- Easily integrated into existing test stations
20 mm Laser Bars – Designed for long high – power laser bars requiring stable electrical contact across the entire emitter length.
Features:
- Full-length contacting
- Rigid mechanical support
- Optimized for high-current pulse testing
- Custom mounting options available
Custom Single Emitter Contact Cards
Because no industry standard exists for single emitter laser chips, Artifex manufactures these cards to order.
Custom designs can accommodate:
- Various chip sizes
- Different bond pad locations
- P-side or N-side contacting
- Multiple probe configurations
- Research prototypes
- Production devices
Our engineering team works directly from customer drawings or sample devices to produce a contact card optimized for your application.
Flexible VCSEL Contact Cards
VCSEL arrays often require unique contact geometries that cannot be served by conventional probe cards.
Our flexible solutions can include:
- Dense multi-contact layouts
- Custom array spacing
- High-speed electrical paths
- Low-profile mechanical designs
- Integration with optical measurement systems
These designs are ideal for R&D laboratories, wafer-level characterization, and production evaluation.
Typical Applications
- High-power diode laser testing
- VCSEL characterization
- Single emitter evaluation
- Reliability testing
- Burn-in systems
- LIV measurements
- Pulsed laser characterization
- Research laboratories
- Production quality control
Standard Bar Length: 5 mm, 10 mm, 20 mm
Contact Type: Precision Spring Probes
Custom Designs: Yes
Single Emitter Cards: Made to Order
VCSEL Solutions: Yes
High Current Compatible: Yes
CAD Reference Available: Yes
We believe customers should have the flexibility to manufacture their own contact cards if preferred.
To support this, we provide:
- Overall mechanical dimensions
- Mounting hole locations
- Probe spacing
- Recommended materials
- CAD reference drawings
- Integration recommendations
This allows laboratories to integrate our designs into custom fixtures or manufacture replacement cards internally.
High-Speed Driver Considerations
Important:
When using fast current pulse drivers, contact card layout becomes extremely important.
Long electrical paths, large loop areas, and unnecessary conductor length introduce:
- Increased parasitic inductance
- Current overshoot
- Ringing
- Reduced pulse fidelity
- Longer rise times
For nanosecond and sub-nanosecond pulse applications, we recommend:
- Keeping electrical paths as short as possible
- Minimizing loop area
- Using low-inductance interconnections
- Maintaining good ground return paths
- Avoiding unnecessary adapter boards
Contact our qualified sales team for advise on contact card layouts optimized for high-speed pulsed laser testing.
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