In The Fast Lane!
- Complete Solution
- Currents up to 600 ampere
- Very compact
Powerful short pulse laser diode characterization system for laser diodes and LEDs at the chip, bar or submount level.
The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading.
CW testing is available up to 20A max. current.
- Pulsed testing and CW testing for models up to 20A
- Maximum currents: 250mA up to 600A
- Maximum number of current steps: 4000
- Interface: USB
- Rise time: 70ns (F-version); 500ns (L-version);
1µs (XL-version) - Throughput: typically 1s per device
The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level.
The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading.
We offer three versions of the LIV100 source measurement units (SMU) differing in speed and pulse length.
Each version is available in any given maximum current (denoted by “xxx” in the list below).
LIV100-Fxxx: fast version with 70ns rise time and pulse durations from 150ns.
The longest pulse length at maximum current is typically limited to 10µs.
LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs.
The longest pulse length at maximum current is typically limited to 100µs.
LIV100-XLxxx: extra long pulse version with rise time of 1µs. The shortest pulse duration is 5µs.
The longest pulse length at maximum current is 2000µs.
PRINCIPLES OF OPERATION
LIV
All three source measurement units are controlled via a USB port for automated liv measurements. A parameter set is uploaded from the control computer.
Following the start command, the LIVs then perform the complete measurement sequence fully autonomously.
The fast data acquisition provides for high throughput.
The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:
The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra.
Artifex Engineering supports this laser diode characterization system with a custom strip line or contact card configuration service.
FIELDS OF APPLICATION
Applications include laser diode characterization before and after submounting or packaging, inspection of incoming goods and for OEMs.
The software delivered with the unit allows for one-click generation of a full pdf data sheet for the device under test.
The short pulse capability of the laser diode characterization system LIV100 ensures that the device under test can be measured with negligible thermal loading.
This fact can be exploited to determine the thermal resistance of the contact to a submount or package (see the Video and Downloads).
| wdt_ID | wdt_created_by | wdt_created_at | wdt_last_edited_by | wdt_last_edited_at | Parameter | Conditions | Resolution | Min | Typ | Max | Unit |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 27 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Inputs:
|
||||||
| 28 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Sampling rate | selectable: 20/n MS/s with n=1..20 | n.a. | 1 | 20 | MS/s | |
| 29 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | A/D Resolution | 13 | bit | ||||
| 30 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Photodiode gain | optimum gain automatically selected |
1 10 |
V/mA | |||
| 31 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Transimpedance amplifier rise time1 | Input capacitance <20pF, gain = 1kΩ | 50 | ns | |||
| 32 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Output | ||||||
| 33 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Pulse duration2 version F | 20MS/s sampling rate 1MS/s sampling rate |
0.050 1 |
0.150 1 |
100 2000 |
µs | |
| 34 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Pulse duration2 version L | 20MS/s sampling rate 1MS/s sampling rate |
0.050 1 |
2 2 |
100 2000 |
µs | |
| 35 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Pulse duration2 version XL | 20MS/s sampling rate 1MS/s sampling rate |
0.050 1 |
5 5 |
100 2000 |
µs | |
| 36 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Rise time | F L XL |
701 420 700 |
100 500 1000 |
ns | ||
| 37 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Current overshoot at maximum current5 | 0 | 5 | % | |||
| 38 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Pulse separation | selectable: 50 ·n µs with n= 2..10 000 | 50 | 100 | 500 000 | µs | |
| 39 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Repetition rate | 100 | kHz | ||||
| 40 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Current range |
LIV100-F002, -L002 or -XL002 LIV100-F040, -L040 or -XL040 LIV100-F080, -L080 or -XL080 LIV100-F120, -L120 or -XL120 LIV100-L200 or -XL200 LIV120-XL400 LIV120-XL600 |
0.0005 0.01 0.02 0.03 0.05 0.10 0.15 |
0.01 0.2 0.4 0.6 1.0 2.0 2.0 |
2 40 80 120 200 400 600 |
A | |
| 41 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | D/A resolution | 12 | bit | ||||
| 42 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Compliance voltage | F L XL |
8 | 20 | V | ||
| 43 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Duty cycle quick rise version (examples only: any current range from 1A to 600A may be specified at time of purchase) |
LIV100-F002 LIV100-F040 LIV100-F080 LIV100-F120 |
25 1.5 0.7 0.5 |
% | |||
| 44 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Duty cycle long pulse version (examples only: any current range from 1A to 600A may be specified at time of purchase) |
LIV100-L002 LIV100-L040 LIV100-L080 LIV100-L120 LIV100-L200 |
35 2.9 1.5 1.0 0.6 |
% | |||
| 45 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Duty cycle long pulse version (examples only: any current range from 1A to 600A may be specified at time of purchase) |
LIV100-XL002 LIV100-XL040 LIV100-XL080 LIV100-XL120 LIV100-XL200 LIV100-XL400 LIV100-XL600 |
35 2.9 1.5 1.0 0.6 0.3 0.2 |
% | |||
| 46 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Signal processing | ||||||
| 47 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Depth of storage | 512 | kB | ||||
| 48 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Number of channels | 1 | 1 | 250 | |||
| 49 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | PC Interface | ||||||
| 50 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Type | USB; 100kB/s | |||||
| 51 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | Dimensions | ||||||
| 52 | benjamin | 04/05/2026 03:50 PM | benjamin | 04/05/2026 03:50 PM | DAQ unit | 150 x 140 x 135 (w x l x h) | mm |
Front Panel
Optical Measurement
The optical power is measured with an integrating sphere as the collecting element. The integrated optical power within the sphere is sampled at an optical port fitted with a fibre FC receptacle. The sampled optical power is transmitted to the main system through a multimode optical fibre patch cable where it is measured with a photodiode and transimpedance amplifier within the enclosure of the LIV100 unit. The complete optical chain (integrating sphere –
optical fibre – photodiode – transimpedance amplifier) is calibrated as a unit before shipping.
Current Output
The current output to drive the DUT is delivered from the slot receptacle at the top of the front panel.
Artifex Engineering provides full support to design and manufacture custom strip line contact cards for contacting laser bars, chips, TO, C-Mount, CS-Mount, etc. Contact us for your requirements.
The contact card is inserted into the card receptacle with the key slot on the left hand side of the receptacle. The correct polarity is guaranteed through the key slot in the card.
- Rise time: 70ns (F-version); 500ns (L-version); 1µs (XL-version)
- Maximum currents: 250mA up to 600A
- Wavelength range: 250-1000nm; 400-1600nm; 800-2490nm
- Simultaneous spectrum measurement
We will gladly adapt, for example, the wavelength or the current to suit your application. Let us know your requirements.
- Integrating Spheres
- Strip line connectors
- Mounts and vacuum chucks
- TECs and TEC drivers
Application Note: Comparison of Voltage and Current Sources
Application Note: Considerations for Laser Contacting
Application Note: Choice of Compliance Voltage in Current Sources
Application Note: Effect of Pulse Duration on Bar Temperature
Application Note: Contacting single emitters on a laser bar on a vacuum chuck
Application Note: Measuring Threshold Accurately with the LIV100
General Operation
What does LIV stand for?
LIV stands for Light-Current-Voltage, referring to the three parameters measured during laser diode characterization.
What measurements can the LIV100/LIV120 perform?
Typical measurements include:
- L-I curves (optical power vs current)
- V-I curves (forward voltage vs current)
- Threshold current
- Slope efficiency
What types of devices can be tested?
- Laser diodes
- LEDs
- VCSELs
- Photonic components requiring current and optical characterization
What is the difference between LIV100 and LIV120?
The LIV100 is a short pulse device used for unpackaged devices such as chips or bars. The LIV120 is a QCW/CW device generally used for mounted or packaged devices such as TO and CS mounts.
I require a specific current range that I do not see on your website or brochure, is it possible to request custom current or voltage ranges?
It is typically straightforward to adjust these ranges, simply inquire with your requirements and a device will be matched to your project.
Measurement Questions
How is optical power measured during LIV testing?
Using an integrated detector such as a photodiode or integrating sphere connected to the system.
What is threshold current?
The threshold current is the current level at which the laser diode begins to emit coherent laser light.
What is slope efficiency?
Slope efficiency describes how efficiently current is converted into optical power above the threshold.
Can pulsed measurements be performed?
Yes. Pulsed operation reduces heating effects during measurement.
How do I connect a laser diode to the LIV100?
The LIV100 uses strip line technology to minimize inductance. The laser diode is connected via the output terminals with proper polarity. Contact cards are available upon request for custom connection configurations.
How do I connect a laser diode to the LIV120?
The laser diode is connected via the output terminals with proper polarity. If this is a low current device there will be a DB9 output.
What maintenance is required?
Typical maintenance includes:
- periodic calibration
- connector inspection
- optical surface cleaning (dusting with clean, dry air only)
Integration
Can the LIV system be automated?
The system supports automated measurements via software control.
Can temperature control be integrated?
Thermoelectric controllers and temperature-controlled stages can be added.
Is it suitable for production testing?
Yes, especially for automated LIV sweeps. The system can perform complete laser characterization measurements in extremely short time for high throughput.
Application Notes
Do you need further information? Find useful links here!
Single Emitter Contacting on Laser Bar
Training on contacting naked chips and bars for LIV measurement
You might also be interested in
Artifex Software Development Kit
The SDK is a fixed, free component when purchasing a device.
It comes with the source code of the application program (in VB.net) and a LabView VI with the basic functions of the instrument. A description of the communication with the devices and a list of the commands used is also included.
