Laser Diode Characterization System LIV100

• Pulsed testing and CW testing for models up to 20A
• Maximum currents: 250mA up to 600A
• Maximum number of current steps: 4000
• Interface: USB
• Rise time: 70ns (F-version); 500ns (L-version);
  1µs (XL-version)
• Throughput: typically 1s per device

The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level.

The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading.

We offer three versions of the LIV100 differing in speed and pulse length.

Each version is available in any given maximum current (denoted by “xxx” in the list below).

• LIV100-Fxxx: fast version with 70ns rise time and pulse durations from 150ns.
  The longest pulse length at maximum current is typically limited to 10µs.
• LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs.
  The longest pulse length at maximum current is typically limited to 100µs.
• LIV100-XLxxx: extra long pulse version with rise time of 1µs. The shortest pulse duration is 5µs.
  The longest pulse length at maximum current is 2000µs.

PRINCIPLES OF OPERATION

LIV

All three systems are controlled via a USB port for automated liv measurements. A parameter set is uploaded from the control computer.

Following the start command, the LIVs then perform the complete measurement sequence fully autonomously.

The fast data acquisition provides for high throughput.

Pulsed LIV mode

The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:

Pulsed burst mode

The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra.

Artifex Engineering supports this laser diode characterization system with a custom strip line or contact card configuration service.

FIELDS OF APPLICATION

Applications include laser diode characterization before and after submounting or packaging, inspection of incoming goods and for OEMs.

The software delivered with the unit allows for one-click generation of a full pdf data sheet for the device under test.

The short pulse capability of the laser diode characterization system LIV100 ensures that the device under test can be measured with negligible thermal loading.

This fact can be exploited to determine the thermal resistance of the contact to a submount or package (see the “Tutorial” and “Downloads” tab).

¹ F-versions at 60A. The maximum available current for the F-version is 120A.

² With 2µs pulse width. Measurement of 200 pulses and 0,2% duty cycle.

³ Per ANSI/IEEE standard 181-1977: 10% – 90%.

⁴ Optimum sampling rate is automatically selected.

⁵ With optimized strip line connector, no load matching required

• Rise time: 70ns (F-version); 500ns (L-version); 1µs (XL-version)
• Maximum currents: 250mA up to 600A
• Wavelength range: 250-1000nm; 400-1600nm; 800-2490nm
• Simultaneous spectrum measurement

We will gladly adapt, for example, the wavelength or the current to suit your application. Let us know your requirements.

• Integrating Spheres
• Strip line connectors
• Mounts and vacuum chucks
• TECs and TEC drivers