THE Turnkey Solution!
- Complete Solution
- Extraordinary Performance
- Very compact
The LIV Laser Characterization Series of instruments are measurement systems for the electro-optical laser diode characterization and LED characterization, whether packaged or in bare chip form.
These source measurement units (SMU) perform for high throughput.
CW testing is available.
- Pulsed testing, QCW and CW testing
- Maximum currents: 250mA up to 1200A
- Maximum number of current steps: 4000
- Interface: USB
- Rise time LIV100: 70ns (F-version); 500ns (L-version); 1µs (XL-version)
- Rise time LIV120: 5µs – 600µs (dependant on max. current)
- Throughput: typically 1s per device
PROPERTIES
The turnkey laser diode testing systems LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control LIV measurements. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom source measurement units are available with even more current!
FIELDS OF APPLICATION
Applications include characterization of laser diodes and LEDs before and after submounting or packaging, inspection of incoming goods and for OEMs. The fast data acquisition provides for high throughput. Artifex Engineering supports this high current laser diode tester with a custom strip line or contact card configuration service.
Laser Diode Characterization System LIV100 – System Overview – English
Laser Diode Characterization System LIV100 – System Overview – Chinese
Laser Diode Characterization System LIV120 – System Overview – English
Laser Diode Characterization System LIV120 – System Overview – Chinese
How to use LIV Contact Card – English
How to use LIV Contact Card – Chinese
- Rise time LIV100: 70ns (F-version); 500ns (L-version); 1µs (XL-version)
- Maximum currents: 250mA up to 1200A
- Wavelength range: 250-1000nm; 400-1600nm; 800-2000nm; 800-2490nm; 1000-2200nm; 1300-2500nm
- Simultaneous spectrum measurement
We will gladly adapt, for example, the wavelength or the current to suit your application. Let us know your requirements.
Connection lines
Strip line connectors
Application Note: Considerations for Laser Contacting
Application Note: Choice of Compliance Voltage in Current Sources
Application Note: Effect of Pulse Duration on Bar Temperature
Application Note: Contacting single emitters on a laser bar on a vacuum chuck
Application Note: Measuring Threshold Accurately with the LIV100
Laser Diode Characterization System | LIV100
- Complete Solution
- Currents up to 600A
- Very Compact
The LIV100 is a powerful short-pulse laser diode characterization system designed for testing laser diodes and LEDs at the chip, bar, or submount level. Its extremely fast rise time with virtually no overshoot enables accurate measurements of thermally “naked” devices while minimizing thermal stress on the device under test.
The system supports CW testing up to a maximum current of 20 A and offers pulsed operation with pulse durations ranging from 150 ns to 2000 µs. The fast rise-time version achieves rise and fall times of just 50 ns at currents up to 60 A, ensuring precise control of the drive current.
This unique performance allows reliable high-power laser diode (HPLD) testing, even for sensitive devices at the chip or bar level, without introducing significant thermal loading. As a result, the LIV100 enables highly accurate LIV characterization while protecting delicate semiconductor laser structures during measurement.
Laser Diode Characterization System | LIV100
- Complete Solution
- Currents up to 600A
- Very Compact
The LIV100 is a powerful short-pulse laser diode characterization system designed for testing laser diodes and LEDs at the chip, bar, or submount level. Its extremely fast rise time with virtually no overshoot enables accurate measurements of thermally “naked” devices while minimizing thermal stress on the device under test.
The system supports CW testing up to a maximum current of 20 A and offers pulsed operation with pulse durations ranging from 150 ns to 2000 µs. The fast rise-time version achieves rise and fall times of just 50 ns at currents up to 60 A, ensuring precise control of the drive current.
This unique performance allows reliable high-power laser diode (HPLD) testing, even for sensitive devices at the chip or bar level, without introducing significant thermal loading. As a result, the LIV100 enables highly accurate LIV characterization while protecting delicate semiconductor laser structures during measurement.
Laser Diode Characterization System | LIV120
- Turnkey Solutions
- Pulsed, QCW and CW
- LIV and Burn-In-Test
The LIV120 is a versatile CW/QCW laser diode tester designed for reliable characterization and testing of laser diodes and LEDs. It combines powerful measurement capabilities with a compact design and offers full single-channel burn-in functionality, making it suitable for both laboratory environments and OEM integration.
The system is controlled via a USB interface, enabling fully automated measurements from a host computer. A predefined parameter set is uploaded to the instrument, and once the measurement is started, the LIV120 performs the complete test sequence autonomously. This ensures consistent and repeatable measurements while reducing operator effort.
Designed as a powerful yet cost-effective pulsed, QCW, and CW laser diode characterization system, the LIV120 supports a wide range of testing applications including diode characterization, incoming goods quality control, and OEM integration.
The unit is available with different source measurement unit (SMU) output stages, covering current ranges from 250 mA up to 40 A in a compact enclosure, and up to 1200 A in 19-inch rack systems for high-power applications. For optical power measurements, the LIV120 is compatible with our OPM150 laser power detector heads, ensuring precise and reliable power detection.
Thanks to its optimized architecture, a complete measurement cycle typically takes less than one second, including data transfer to the host computer, enabling fast and efficient device testing in both research and production environments.
Laser Diode Characterization System | LIV120
- Turnkey Solutions
- Pulsed, QCW and CW
- LIV and Burn-In-Test
The LIV120 is a versatile CW/QCW laser diode tester designed for reliable characterization and testing of laser diodes and LEDs. It combines powerful measurement capabilities with a compact design and offers full single-channel burn-in functionality, making it suitable for both laboratory environments and OEM integration.
The system is controlled via a USB interface, enabling fully automated measurements from a host computer. A predefined parameter set is uploaded to the instrument, and once the measurement is started, the LIV120 performs the complete test sequence autonomously. This ensures consistent and repeatable measurements while reducing operator effort.
Designed as a powerful yet cost-effective pulsed, QCW, and CW laser diode characterization system, the LIV120 supports a wide range of testing applications including diode characterization, incoming goods quality control, and OEM integration.
The unit is available with different source measurement unit (SMU) output stages, covering current ranges from 250 mA up to 40 A in a compact enclosure, and up to 1200 A in 19-inch rack systems for high-power applications. For optical power measurements, the LIV120 is compatible with our OPM150 laser power detector heads, ensuring precise and reliable power detection.
Thanks to its optimized architecture, a complete measurement cycle typically takes less than one second, including data transfer to the host computer, enabling fast and efficient device testing in both research and production environments.
Application Notes
Do you need further information? Find useful links here!
Artifex Software Development Kit
The SDK is a fixed, free component when purchasing a device.
It comes with the source code of the application program (in VB.net) and a LabView VI with the basic functions of the instrument. A description of the communication with the devices and a list of the commands used is also included.
FAQs
What does LIV stand for?
LIV stands for Light-Current-Voltage. These are the three parameters measured during laser diode characterization: optical output power (L), drive current (I), and forward voltage (V).
What is an LIV laser diode characterization system?
An LIV system drives a laser diode or LED with a controlled current while recording its optical output power and forward voltage. From these data it determines key electro-optical parameters such as threshold current and slope efficiency. The LIV100 and LIV120 from Artifex Engineering are turnkey LIV systems with integrated source measurement units (SMUs). They are used for R&D, quality control, and production testing.
What measurements can the LIV100 and LIV120 perform?
Typical measurements include:
- L-I curves (optical power vs. current)
- V-I curves (forward voltage vs. current)
- Threshold current
- Slope efficiency
What types of devices can be tested?
The LIV100 and LIV120 test:
- Laser diodes, including high-power laser diodes (HPLDs) and laser bars
- LEDs
- VCSELs
- Other photonic components that require current and optical characterization
Devices can be tested as bare chips, bars, submounts, or in packaged form such as TO and C-mount (CS) packages.
What is the difference between the LIV100 and the LIV120?
The LIV100 is a short-pulse system for unpackaged devices such as chips and bars. Its pulse widths range from 150 ns to 2000 µs, with rise and fall times as fast as 50 ns and virtually no overshoot, which protects thermally sensitive devices during testing.
The LIV120 is a CW/QCW system, also capable of pulsed operation, generally used for mounted or packaged devices such as TO and CS mounts. It adds single-channel burn-in functionality and runs fully autonomous, USB-controlled test sequences.
In short, choose the LIV100 for fast-pulse testing of unmounted chips and bars. Choose the LIV120 for packaged devices, burn-in, production quality control, and OEM integration.
What current ranges do the LIV systems support?
Standard current output stages range from 250 mA for low-power and telecom lasers up to 1200 A for high-power laser bars.
- LIV120: 250 mA to 40 A in a compact enclosure, and up to 1200 A in 19-inch rack systems.
- LIV100: CW operation up to 20 A. The fast rise-time version delivers 50 ns rise and fall times at currents up to 60 A.
Can I request a custom current or voltage range?
Yes. Adjusting current or voltage ranges is typically straightforward. Send your requirements to Artifex Engineering, and a source measurement unit will be matched to your project, including custom SMUs above the standard current ranges.
What is threshold current?
Threshold current is the drive current at which a laser diode begins to emit coherent laser light. Below this point the device emits mainly spontaneous emission, similar to an LED. Above it, stimulated emission dominates and optical power rises steeply with current. Threshold current is a key quality and efficiency indicator for laser diodes.
What is slope efficiency?
Slope efficiency describes how efficiently a laser diode converts drive current into optical power above the threshold current. It is usually expressed in W/A and is determined from the slope of the L-I curve.
How is optical power measured during LIV testing?
Optical power is measured with a detector connected to the LIV system, such as a photodiode or an integrating sphere. The LIV120 is compatible with the Artifex Engineering OPM150 laser power detector heads. Artifex Engineering also offers polymer integrating spheres for capturing the full emitted power of divergent laser diodes and LEDs.
Can pulsed measurements be performed?
Yes. Both the LIV100 and LIV120 support pulsed operation. Pulsed measurements reduce heating of the device under test, which is especially important for bare chips and bars without a heat sink. The LIV100 offers pulse durations from 150 ns to 2000 µs. The LIV120 supports pulsed, QCW, and CW modes.
Why is a fast rise time important for testing high-power laser diodes?
Bare laser chips and bars are often “thermally naked”: they have no heat sink yet, so even short current pulses can heat them and distort the measurement or damage the device. The LIV100 has rise and fall times of 50 ns with virtually no overshoot. This keeps thermal load minimal and delivers accurate LIV data without stressing the semiconductor structure.
How fast is a complete LIV measurement?
With the LIV120, a complete measurement cycle typically takes less than one second, including data transfer to the host computer. This makes it suitable for high-throughput production testing as well as laboratory use.
Does the LIV120 support burn-in testing?
Yes. The LIV120 offers full single-channel burn-in functionality in addition to LIV characterization, so one instrument covers both tasks.
How do I connect a laser diode to the LIV100?
The LIV100 uses strip line technology to minimize inductance, which is essential for clean, fast current pulses. The laser diode is connected to the output terminals with correct polarity. For custom connection setups, Artifex Engineering provides contact cards and a strip line configuration service matched to your device geometry and current requirements.
How do I connect a laser diode to the LIV120?
The laser diode is connected to the output terminals with correct polarity. Low-current versions of the LIV120 provide a DB9 output connector.
Can I test laser diodes before they are mounted or packaged?
Yes. The LIV100 is specifically designed for unmounted devices at chip, bar, or submount level. Custom contact cards and strip lines from Artifex Engineering allow reliable contacting of bare devices.
What maintenance is required?
Typical maintenance includes:
- Periodic calibration
- Inspection of connectors
- Cleaning optical surfaces, using clean, dry air only
Can the LIV system be automated?
Yes. Both systems support automated measurements via software control. The LIV120 connects to a host computer via USB. You upload a predefined parameter set, and after the measurement starts, the instrument runs the complete test sequence on its own for consistent, repeatable results.
Is software included with the LIV systems?
Yes. The Artifex Software Development Kit (SDK) is included free of charge with every device. It contains:
- The full source code of the application program in VB.NET
- A LabVIEW VI with the instrument’s basic functions
- A description of the device communication
- A complete list of instrument commands
Can temperature control be integrated?
Yes. Thermoelectric cooler (TEC) controllers and temperature-controlled stages can be added to the LIV setup. Artifex Engineering offers laser mounts and TEC drivers for temperature-stabilized laser diode testing.
Is the LIV system suitable for production testing?
Yes, especially for automated LIV sweeps. The systems perform complete laser characterization in an extremely short time, with the LIV120 typically finishing a full cycle in under one second. This supports high-throughput production testing and incoming goods inspection.
Can the LIV systems be integrated into OEM equipment?
Yes. The LIV120 is designed for OEM integration, with a compact design, USB control, autonomous test sequences, and an open command set documented in the SDK.
What are typical applications of the LIV100 and LIV120?
Typical applications include:
- R&D characterization of laser diodes, VCSELs, and LEDs
- Testing high-power laser bars and chips before packaging
- Incoming goods inspection of purchased laser diodes
- Production quality control
- Burn-in testing
- OEM integration into automated test systems
