THE Turnkey Solution!
- Complete Solution
- Extraordinary Performance
- Very compact
The LIV Laser Characterization Series of instruments are measurement systems for the electro-optical laser diode characterization and LED characterization, whether packaged or in bare chip form.
These source measurement units (SMU) perform for high throughput.
CW testing is available.
- Pulsed testing, QCW and CW testing
- Maximum currents: 250mA up to 1200A
- Maximum number of current steps: 4000
- Interface: USB
- Rise time LIV100: 70ns (F-version); 500ns (L-version); 1µs (XL-version)
- Rise time LIV120: 5µs – 600µs (dependant on max. current)
- Throughput: typically 1s per device
PROPERTIES
The turnkey laser diode testing systems LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control LIV measurements. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom source measurement units are available with even more current!
FIELDS OF APPLICATION
Applications include characterization of laser diodes and LEDs before and after submounting or packaging, inspection of incoming goods and for OEMs. The fast data acquisition provides for high throughput. Artifex Engineering supports this high current laser diode tester with a custom strip line or contact card configuration service.
Laser Diode Characterization System LIV100 – System Overview – English
Laser Diode Characterization System LIV100 – System Overview – Chinese
Laser Diode Characterization System LIV120 – System Overview – English
Laser Diode Characterization System LIV120 – System Overview – Chinese
How to use LIV Contact Card – English
How to use LIV Contact Card – Chinese
- Rise time LIV100: 70ns (F-version); 500ns (L-version); 1µs (XL-version)
- Maximum currents: 250mA up to 1200A
- Wavelength range: 250-1000nm; 400-1600nm; 800-2000nm; 800-2490nm; 1000-2200nm; 1300-2500nm
- Simultaneous spectrum measurement
We will gladly adapt, for example, the wavelength or the current to suit your application. Let us know your requirements.
Connection lines
Strip line connectors
Application Note: Considerations for Laser Contacting
Application Note: Choice of Compliance Voltage in Current Sources
Application Note: Effect of Pulse Duration on Bar Temperature
Application Note: Contacting single emitters on a laser bar on a vacuum chuck
Application Note: Measuring Threshold Accurately with the LIV100
General Operation
What does LIV stand for?
LIV stands for Light-Current-Voltage, referring to the three parameters measured during laser diode characterization.
What measurements can the LIV100/LIV120 perform?
Typical measurements include:
- L-I curves (optical power vs current)
- V-I curves (forward voltage vs current)
- Threshold current
- Slope efficiency
What types of devices can be tested?
- Laser diodes
- LEDs
- VCSELs
- Photonic components requiring current and optical characterization
What is the difference between LIV100 and LIV120?
The LIV100 is a short pulse device used for unpackaged devices such as chips or bars. The LIV120 is a QCW/CW device generally used for mounted or packaged devices such as TO and CS mounts.
I require a specific current range that I do not see on your website or brochure, is it possible to request custom current or voltage ranges?
It is typically straightforward to adjust these ranges, simply inquire with your requirements and a device will be matched to your project.
Measurement Questions
How is optical power measured during LIV testing?
Using an integrated detector such as a photodiode or integrating sphere connected to the system.
What is threshold current?
The threshold current is the current level at which the laser diode begins to emit coherent laser light.
What is slope efficiency?
Slope efficiency describes how efficiently current is converted into optical power above the threshold.
Can pulsed measurements be performed?
Yes. Pulsed operation reduces heating effects during measurement.
How do I connect a laser diode to the LIV100?
The LIV100 uses strip line technology to minimize inductance. The laser diode is connected via the output terminals with proper polarity. Contact cards are available upon request for custom connection configurations.
How do I connect a laser diode to the LIV120?
The laser diode is connected via the output terminals with proper polarity. If this is a low current device there will be a DB9 output.
What maintenance is required?
Typical maintenance includes:
- Periodic calibration
- Connector inspection
- Optical surface cleaning (dusting with clean, dry air only)
Integration
Can the LIV system be automated?
The system supports automated measurements via software control.
Can temperature control be integrated?
Thermoelectric controllers and temperature-controlled stages can be added.
Is it suitable for production testing?
Yes, especially for automated LIV sweeps. The system can perform complete laser characterization measurements in extremely short time for high throughput.
Laser Diode Characterization System | LIV100
- Complete Solution
- Currents up to 600A
- Very Compact
The LIV100 is a powerful short-pulse laser diode characterization system designed for testing laser diodes and LEDs at the chip, bar, or submount level. Its extremely fast rise time with virtually no overshoot enables accurate measurements of thermally “naked” devices while minimizing thermal stress on the device under test.
The system supports CW testing up to a maximum current of 20 A and offers pulsed operation with pulse durations ranging from 150 ns to 2000 µs. The fast rise-time version achieves rise and fall times of just 50 ns at currents up to 60 A, ensuring precise control of the drive current.
This unique performance allows reliable high-power laser diode (HPLD) testing, even for sensitive devices at the chip or bar level, without introducing significant thermal loading. As a result, the LIV100 enables highly accurate LIV characterization while protecting delicate semiconductor laser structures during measurement.
Laser Diode Characterization System | LIV100
- Complete Solution
- Currents up to 600A
- Very Compact
The LIV100 is a powerful short-pulse laser diode characterization system designed for testing laser diodes and LEDs at the chip, bar, or submount level. Its extremely fast rise time with virtually no overshoot enables accurate measurements of thermally “naked” devices while minimizing thermal stress on the device under test.
The system supports CW testing up to a maximum current of 20 A and offers pulsed operation with pulse durations ranging from 150 ns to 2000 µs. The fast rise-time version achieves rise and fall times of just 50 ns at currents up to 60 A, ensuring precise control of the drive current.
This unique performance allows reliable high-power laser diode (HPLD) testing, even for sensitive devices at the chip or bar level, without introducing significant thermal loading. As a result, the LIV100 enables highly accurate LIV characterization while protecting delicate semiconductor laser structures during measurement.
Laser Diode Characterization System | LIV120
- Turnkey Solutions
- Pulsed, QCW and CW
- LIV and Burn-In-Test
The LIV120 is a versatile CW/QCW laser diode tester designed for reliable characterization and testing of laser diodes and LEDs. It combines powerful measurement capabilities with a compact design and offers full single-channel burn-in functionality, making it suitable for both laboratory environments and OEM integration.
The system is controlled via a USB interface, enabling fully automated measurements from a host computer. A predefined parameter set is uploaded to the instrument, and once the measurement is started, the LIV120 performs the complete test sequence autonomously. This ensures consistent and repeatable measurements while reducing operator effort.
Designed as a powerful yet cost-effective pulsed, QCW, and CW laser diode characterization system, the LIV120 supports a wide range of testing applications including diode characterization, incoming goods quality control, and OEM integration.
The unit is available with different source measurement unit (SMU) output stages, covering current ranges from 250 mA up to 40 A in a compact enclosure, and up to 1200 A in 19-inch rack systems for high-power applications. For optical power measurements, the LIV120 is compatible with our OPM150 laser power detector heads, ensuring precise and reliable power detection.
Thanks to its optimized architecture, a complete measurement cycle typically takes less than one second, including data transfer to the host computer, enabling fast and efficient device testing in both research and production environments.
Laser Diode Characterization System | LIV120
- Turnkey Solutions
- Pulsed, QCW and CW
- LIV and Burn-In-Test
The LIV120 is a versatile CW/QCW laser diode tester designed for reliable characterization and testing of laser diodes and LEDs. It combines powerful measurement capabilities with a compact design and offers full single-channel burn-in functionality, making it suitable for both laboratory environments and OEM integration.
The system is controlled via a USB interface, enabling fully automated measurements from a host computer. A predefined parameter set is uploaded to the instrument, and once the measurement is started, the LIV120 performs the complete test sequence autonomously. This ensures consistent and repeatable measurements while reducing operator effort.
Designed as a powerful yet cost-effective pulsed, QCW, and CW laser diode characterization system, the LIV120 supports a wide range of testing applications including diode characterization, incoming goods quality control, and OEM integration.
The unit is available with different source measurement unit (SMU) output stages, covering current ranges from 250 mA up to 40 A in a compact enclosure, and up to 1200 A in 19-inch rack systems for high-power applications. For optical power measurements, the LIV120 is compatible with our OPM150 laser power detector heads, ensuring precise and reliable power detection.
Thanks to its optimized architecture, a complete measurement cycle typically takes less than one second, including data transfer to the host computer, enabling fast and efficient device testing in both research and production environments.
Application Notes
Do you need further information? Find useful links here!
Artifex Software Development Kit
The SDK is a fixed, free component when purchasing a device.
It comes with the source code of the application program (in VB.net) and a LabView VI with the basic functions of the instrument. A description of the communication with the devices and a list of the commands used is also included.
